Advancing Manufacturing Technology

iNEMI Meetings at OFC/NFOEC 2012

March 5, 2012
Los Angeles, California

Agenda

Introductions and iNEMI Overview
David Godlewski, iNEMI

Connector Particles Thickness:  Project status
Tatiana Berdinskikh, Celestica International Inc.

Connector separation DOE for contaminated samples
Dave Fisher, TE Connectivity

Controlled separation experimental results
Doug Wilson, PVI Systems

Design for optics cleanliness
Mark Marino, Juniper Networks and Timothy Buelow, Plexus

Evaluation result of scratches and defects on the endface for multi-fiber rectangle ferrule fiber optic connectors
Takashi Shibuya, NEC, and Hideki Isono, Fujitsu

Sensitivity of 40G optic link to conenctor quality:  BER and eye diagram data
Tatiana Berdinskikh, Celestica International Inc.

Standardization study of cleaning method of connector endface for pluggable receptacle type optical transceivers
Takashi Shibuya, NEC, and Hideki Isono, Fujitsu

Development of cleanliness specification for lens-based TOSA and ROSA
Glenn Victor, Oplink, and Doug Wilson, PVI Systems

Operational issues related to optical connectors used in carriers
Ryo Nagase, Yoshiteru Abe

Fully Automated inspection and cleaning system
Tom Micheltree, FiberQA, LLC

Design and performance of PRIZM® LightTurn® connector cleaner
Jillcha Wakjira, US Conec

Design and performance of SFP module cleaner
Toshiaki Satake, USConec


Further information

David Godlewski
+1 717-651-0522
dgodlewski@inemi.org