Start Date: 6/16/2020 11:00 AM EDT
End Date: 6/16/2020 11:45 AM EDT
Tuesday, June 16 / 11:00 a.m. EDT (Americas)
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Since the 1980s there has been enormous growth in the use of electronic devices which has driven similar, if not greater, growth in the number of electrical interconnects. As we become more dependent on these devices the need to ensure their reliability becomes more important. Two factors complicate this effort. The first is the reduction in size of electrical contacts and the commensurate reduction in contact normal force available to ensure a stable interface. The other factor is that reliability is not free. Thus, as the number of interconnects increases, cost considerations drive a need to ensure the reliability of connectors is matched to the needs of their specific applications. Testing protocols to help achieve this match will be discussed in this presentation.
About the Presenter
Vincent C. Pascucci is Senior Principal Engineer, managing the Failure Analysis and Reliability Engineering group within TEConnectivity’s Aerospace, Defense, and Marine business unit. He has worked with TE Connectivity, and previously AMP, since 1984.
Vincent serves as US Technical Advisor to IEC committees TC48 and SC48B and covenor (chair) of SC48B orking Group 5 responsible for electrical and electronic connector testing standards. He has authored papers on connector reliability topics presented at IEEE Holm and American Society for Quality conferences, along with the International Conference on Electrical Connectors, and others.
He is an American Society for Quality Certified Reliability Engineer and a graduate of the University of Rochester with degrees in Mechanical and Geomechanical Engineering.