Start Date: 3/8/2021 9:00 AM CST
End Date: 3/12/2021 4:00 PM CST
Location:
United States
Electronics Assembly Materials and Coatings
Thursday, March 11, 1:30-3:00 p.m. CST (U.S.)
Includes presentation from the iNEMI
Conformal Coating Evaluation for Improved Environmental Protection project:
- iNEMI Conformal Coating Evaluation Test Development
Prabjit Singh, PhD (IBM Corporation)
iNEMI Session: 5G/ High Frequency Materials Characterization Challenges and Opportunities
Track: PCB Fabrication and Materials
Friday, March 12, 10:30 a.m. — 12:00 p.m. CST (U.S.)
Moderator: Urmi Ray (iNEMI)
Presentations:
- High Frequency Measurements Using Wafer Level Techniques
Nathan Orloff (NIST)
- Benchmarking Resonator Based Low Dk/Df Material Measurements
Michael Hill (Intel) and Malgorzata Celuch (QWED)
- Optimizing Measurement Accuracy and Repeatability for High Frequency Measurements
Say Phommakesone and Daisuke Kato (Keysight)
