Statement of Work and Project Statement
The iNEMI Connector Reliability Test Recommendations Project, Phase 1, was organized to address the need for a standardized reliability qualification method for connectors. The project team reviewed current standards pertaining to connector reliability and, in addition, conducted an industry-wide connector reliability survey to determine common metrics for connector reliability guidelines across the industry, resulting in the publication, iNEMI Connector Reliability Test Recommendations Project Report white paper at SMTA 2016.
In addition, the project team recommended additional work to define specific test conditions to be used to evaluate the expected degradation of connectors used under different stress levels in the defined application classes. This could form the basis for standardized reliability test procedures for each application class. Such a system of standardized testing would allow designers to more easily compare connectors during their initial system design phase.
To this end, the Connector Reliability Test Recommendations Proejct, Phase 2, continues this work, by further defining levels of connector stress. It then plans to map these stresses on to the tiers established in Phase 1. In addition, the group plans to define a way to verify this research with a Phase 3 test vehicle.
A Standardized Reliability Evaluation Framework for Connectors – Stress Levels and Test Recommendations, presented by Holly-Dee Rubin (Nokia Bell Labs), at the 65th IEEE Holm Conference (September 15-18, 2019; Milwaukee, Wisconsin).
Presentation: Connector Reliability Test Recommendations Project, Phase 2 End-of-Project Webinar (October 17/18, 2018)
Call-for-Participation Webinar (January 12/13, 2017)
Previous Related Work