Advancing Manufacturing Technology

Agenda for iNEMI Optoelectronics Meeting at OFC

March 21, 2016
9:00 a.m. - 5:15 p.m. PDT

iNEMI Optoelectronics Meetings at OFC 2016
Anaheim Convention Center, Room #207C
Anaheim, California

More information about this meeting, including registration.

Agenda

9:00 – 9:15 a.m.
Introductions and iNEMI Overview
David Godlewski, iNEMI
 
9:15 – 9:30 a.m.
Project Updates
Development of cleanliness specification for expanded beam connectors project
Tatiana Berdinskikh, Celestica

9:30 – 10:00 a.m.
Impact of dust on Insertion Loss on MT12F lens plate
Tom Coughlin, Molex
 
10.00 – 1030 a.m.
Images processing of expanded beam connectors
Doug Wilson, FiberQA
 
10:30 – 10:45 a.m.
Break
 
10:45 – 11:15 a.m.
Multimode dust calculations
Michael Kadar-Kallen, CommScope
 
11:15 – 11:45 a.m.
Raytracing modeling for IL for expanded beam connectors
Christine Chen, Foxconn Interconnect Technology
 
11:45 a.m. – 1:00 p.m.
Break
 
1:00 – 1:30 p.m.
PSMC Photonics Updates
Bob Pfahl, iNEMI
 
1:30 – 1:50 p.m.
Impact of contamination and scratches on PRIZM MT connector
Tom Mitcheltree, USConec
 
1:50 – 2:20 p.m.
Methodology for controlled application of dust to PRIZM MT and the related impact of occlusion on signal integrity
Kevin Chaloupka, HP
 
2:20 – 2:40 p.m.
Measurements of reproducibility effects (focus and noise)
Doug Wilson, FiberQA
 
2:40 – 3:00 p.m.
Break
 
3:00 – 3:30 p.m.
Scratch recognition round robin
Mike Gurreri, Commscope
 
3:30 – 3:45 p.m.
Progress on cleaning free receptacle
Sho Kondo, TOTO
 
3:45 – 4:00 p.m.
MFD receptacle design for SiP Lens coupling and and butt joint coupler
Sho Kondo, TOTO
 
4:00 – 4:15 p.m.
iNEMI Roadmap Review
David Godlewski, iNEMI
 
4:15 – 5:00 p.m.
Optoelectronics gaps analysis working session
Tatiana Berdinskikh, Celestica
 
5:00 – 5:15 p.m.
Wrap up/summary