Development of Cleanliness Specification for Expanded Beam Connectors Project, Phase 1

Dr. Tatiana Berdinskikh,
Celestica

 

End-of-Project Webinar

This webinar outlines the impact of contamination and synthetic defects on optical performance (transmitted power) of expanded beam optical connectors. In addition, the webinar will outline a proposed cleanliness specification for expanded beam connectors from the results of the investigation of impact contamination and defects.
       Presentation (July 20, 2016)
       Recording

Presentations

Statement of Work

Background

Expanded Beam optical connectors use various techniques that diverge light into either a collimated or focused beam, thus eliminating the need for physical contact between mating fibers. Unlike existing lensed TOSA/ROSA devices and traditional MT interconnects, some expanded beam products are z-axis insensitive and significantly less susceptible to the effects of contamination.
 
To date, no formal inspection contamination criteria have been adopted by the industry for any expanded beam connector. This project is being organized to develop recommendations for visual inspection criteria for lens-based connectors based on experimental and modeling data.

Project Objectives

  • Investigate the impact of contamination and synthetic defects on optical performance (transmitted power) of expanded beam optical connectors.
  • Develop a cleanliness specification for expanded beam connectors from the results of the investigation of impact contamination and defects.

Project Focus

As the first step to assess the effect of contaminants on an Expanded Beam optical connector, a series of experiments using multi-mode optical fiber (MMF) terminated with the connector were performed by a connector manufacturer. In these experiments, a set of (15) 12-fiber jumpers were selected as the devices to be investigated.  Insertion loss was measured before and after the application of contamination and scratches.
 
To correlate the level of contamination with the corresponding degradation in performance, the raw images were processed and quantified by the use of a Keyence inspection system. These measurements were confirmed by the use of bi-focal microscopes. From this data, a set of inspection criteria was recommended.
 
Criteria:  Which is specific to family of expanded beam optics, which encompass a range of spot sizes of X +/- Xum.
 
The Development of Cleanliness Specification for Expanded Beam Connectors Project will perform a series of additional experiments, based on the spot (sizes of X +/- Xum) inspection criteria of other manufacturers’ expanded beam optical connectors. The group's goal is to define a formal inspection criteria.

For Additional Information

David Godlewski
+1 717-651-0522
dgodlewski@inemi.org