Structural Test of External Memory (Boundary Scan Adoption, Phase 2)

End-of-Project Webinar, Phase 2 Addendum

  • Presentation:  Boundary Scan, Phase 2 (Structural Test of DDR Memory), presented by Phil Geiger (May 7, 2014)
  • This webinar is for iNEMI members only

End-of-Project Webinar, Phase 2

  • Presentation:  Structural Test of External Memory Devices (Boundary Scan Adoption Project, Phase 2) (May 24, 2012)
  • This webinar is for iNEMI members only

Project Objective

This initiative will evaluate potential solutions to issues related to memory device testing to identify what the current and future industry best practices are.

Statement of Work and Project Statement

For Additional Information

David Godlewski
+1 717-651-0522
dgodlewski@inemi.org